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Title: High Cubic-Phase Purity InN on MgO (001) Using Cubic-Phase GaN as a Buffer Layer

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3666291· OSTI ID:21612375
 [1];  [1];  [2]; ; ; ; ;  [3]
  1. Department of Physics, Faculty of Science, Chulalongkorn University, Bangkok 10330 (Thailand)
  2. Nanoscience and Technology, Graduate school, Chulalongkorn University, Bangkok 10330 (Thailand)
  3. Graduate School of Science and Engineering, Saitama University, Saitama-shi 338-8570 (Japan)

High cubic-phase purity InN films were grown on MgO (001) substrates by molecular beam epitaxy with a cubic-phase GaN buffer layer. The cubic phase purity of the InN grown layers has been analyzed by high resolution X-ray diffraction, {mu}-Raman scattering and transmission electron microscopy. It is evidenced that the hexagonal-phase content in the InN overlayer much depends on hexagonal-phase content in the cubic-phase GaN buffer layer and increases with increasing the hexagonal-phase GaN content. From Raman scattering measurements, in addition, the InN layer with lowest hexagonal component (6%), only Raman characteristics of cubic TO{sub InN} and LO{sub InN} modes were observed, indicating a formation of a small amount of stacking faults, which does not affect on vibrational property.

OSTI ID:
21612375
Journal Information:
AIP Conference Proceedings, Vol. 1399, Issue 1; Conference: 30. international conference on the physics of semiconductors, Seoul (Korea, Republic of), 25-30 Jul 2010; Other Information: DOI: 10.1063/1.3666291; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English

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