Coherent Cone-Beam X-ray Microscopy

Journal Article · Fri Sep 09 00:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3625394· OSTI ID:21608308

Harder, R; Xiao, X ^[1]

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1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

A novel full-field imaging method using the (111) Bragg diffraction of a sub-micron gold crystal as the divergent cone-beam for sample illumination is reported. The divergence of the illumination allows for very high magnification, limited only by the achievable ratio of the crystal-to-sample and sample-to-detector distances. In this case an x-ray magnification of approximately 115 was achieved.

• OSTI ID: 21608308
• Journal Information: AIP Conference Proceedings, Vol. 1365, Issue 1; Conference: 10. international conference on X-ray microscopy, Chicago, IL (United States), 15-20 Aug 2010; Other Information: DOI: 10.1063/1.3625394; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BRAGG REFLECTION
COHERENT RADIATION
CONES
CRYSTALS
GOLD
ILLUMINANCE
MICROSCOPY
PHOTON BEAMS
PLATES
SYNCHROTRON RADIATION
X RADIATION
X-RAY SOURCES
ZONES
BEAMS
BREMSSTRAHLUNG
ELECTROMAGNETIC RADIATION
ELEMENTS
IONIZING RADIATIONS
METALS
RADIATION SOURCES
RADIATIONS
REFLECTION
TRANSITION ELEMENTS