Synchronous (Lock-in) Measurement Techniques for Magnetic Contrast Enhancement in STXM
- NSLS-II, Bld.703 BNL, Upton, NY 11973-5000 (United States)
- CLS, 101 Perimeter Rd, Saskatoon, S7N0X4 (Canada)
- Department of Applied Physics, Columbia University, New York, NY 10027 (United States)
We have explored the capabilities of synchronous ('lock-in') point detection techniques to enhance the x-ray magnetic circular dichroism (XMCD) contrast in scanning x-ray transmission microscopy (STXM) of magnetic thin-film microstructures. Local absorption contrast, measured synchronously with low-amplitude (<10 Oe) and low-frequency (<200 hz) longitudinal fields perturbing the near-remanent magnetization state, reveal a strong spatial dependence of the response, with a roll-off in frequency response above 200 Hz. In this context, synchronous measurement affords us a basis for imaging the relation between energy loss and the sweeping rate. We speculate that the lock-in approach will be uniquely suited for detailing stochastic and deterministic frequency-dependent events in the process of magnetization reversal.
- OSTI ID:
- 21608302
- Journal Information:
- AIP Conference Proceedings, Vol. 1365, Issue 1; Conference: 10. international conference on X-ray microscopy, Chicago, IL (United States), 15-20 Aug 2010; Other Information: DOI: 10.1063/1.3625372; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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43 PARTICLE ACCELERATORS
ABSORPTION
AMPLITUDES
BEAM OPTICS
ENERGY LOSSES
FREQUENCY DEPENDENCE
MAGNETIC CIRCULAR DICHROISM
MAGNETIC MATERIALS
MAGNETIZATION
MICROSCOPY
MICROSTRUCTURE
SPACE DEPENDENCE
STOCHASTIC PROCESSES
THIN FILMS
X RADIATION
X-RAY SOURCES
DICHROISM
ELECTROMAGNETIC RADIATION
FILMS
IONIZING RADIATIONS
LOSSES
MATERIALS
RADIATION SOURCES
RADIATIONS
SORPTION