Surface Detection in a STXM Microscope

Journal Article · Fri Sep 09 00:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3625335· OSTI ID:21608279

Behyan, S; Haines, B; Urquhart, S G ^[1]; Karanukaran, C; Wang, J ^[2]; Obst, M ^[2]; Tyliszczak, T ^[3]

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1. Department of Chemistry, University of Saskatchewan, Saskatoon, SK (Canada)
2. Canadian Light Source, University of Saskatchewan, Saskatoon, SK (Canada)
3. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA (United States)

We have modified scanning transmission x-ray microscopes (STXM) at the Canadian Light Source and the Advanced Light Source with total electron yield (TEY) detection (TEY-STXM). This provides improved surface-sensitive detection, simultaneous with existing bulk-sensitive transmission detection in the STXM microscopes. We have explored sample-current and channeltron-based electron yield detection. Both approaches provide improved surface sensitive imaging and spectroscopy, although channeltron-based detection is superior. TEY-STXM provides surface sensitive imaging of ultrathin films such as phase-separated Langmuir-Blodgett monolayer films, as well as differentiation of surface and bulk oxides of patterned metallic thin films. This paper will outline the experimental challenges of this method and the opportunities for correlative surface and bulk measurements of complex samples.

• OSTI ID: 21608279
• Journal Information: AIP Conference Proceedings, Vol. 1365, Issue 1; Conference: 10. international conference on X-ray microscopy, Chicago, IL (United States), 15-20 Aug 2010; Other Information: DOI: 10.1063/1.3625335; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
07 ISOTOPES AND RADIATION SOURCES
ADVANCED LIGHT SOURCE
CANADIAN ORGANIZATIONS
DETECTION
ELECTRON SOURCES
LAYERS
LIGHT SOURCES
METALS
OXIDES
SURFACES
THIN FILMS
X RADIATION
X-RAY SOURCES
X-RAY SPECTRA
X-RAY SPECTROSCOPY
CHALCOGENIDES
ELECTROMAGNETIC RADIATION
ELEMENTS
FILMS
IONIZING RADIATIONS
NATIONAL ORGANIZATIONS
OXYGEN COMPOUNDS
PARTICLE SOURCES
RADIATION SOURCES
RADIATIONS
SPECTRA
SPECTROSCOPY
STORAGE RINGS
SYNCHROTRON RADIATION SOURCES