Synthesis and microstructural TEM investigation of CaCu{sub 3}Ru{sub 4}O{sub 12} ceramic and thin film
- Universite Francois Rabelais, LEMA, UMR 6157 CNRS-CEA, Parc de Grandmont, 37200 Tours (France)
CaCu{sub 3}Ru{sub 4}O{sub 12} (CCRO) is a conductive oxide having the same structure as CaCu{sub 3}Ti{sub 4}O{sub 12} (CCTO) and close lattice parameters. The later compound is strongly considered for high density parallel plates capacitors application due to its so-called colossal dielectric constant. The need for an electrode inducing CCTO epitaxial growth with a clean and sharp interface is therefore necessary, and CCRO is a good potential candidate. In this paper, the synthesis of monophasic CCRO ceramic is reported, as well as pulsed laser deposition of CCRO thin film onto (001) NdCaAlO{sub 4} substrate. Structural and physical properties of bulk CCRO were studied by transmission electron microscopy and electron spin resonance. CCRO films and ceramic exhibited a metallic behavior down to low temperature. CCRO films were (001) oriented and promoted a CCTO film growth with the same orientation. - Graphical Abstract: Structure of CaCu{sub 3}Ru{sub 4}O{sub 12} showing the RuO{sub 6} octahedra and the square planar environment for Cu{sup 2+}. Highlights: > In this study, we investigate the structural properties and microstructure of ceramics CaCu{sub 3}Ru{sub 4}O{sub 12}. > We study the conduction properties of polycrystalline material. > Then we synthesize the conductive thin film which is deposited on a high K material with the same structure (CaCu{sub 3}Ti{sub 4}O{sub 12}).
- OSTI ID:
- 21580028
- Journal Information:
- Journal of Solid State Chemistry, Vol. 184, Issue 10; Other Information: DOI: 10.1016/j.jssc.2011.07.041; PII: S0022-4596(11)00420-8; Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; ISSN 0022-4596
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
CAPACITORS
CERAMICS
COPPER IONS
DENSITY
ELECTRON SPIN RESONANCE
ENERGY BEAM DEPOSITION
LASER RADIATION
LATTICE PARAMETERS
MICROSTRUCTURE
OXIDES
PERMITTIVITY
PEROVSKITE
POLYCRYSTALS
PULSED IRRADIATION
SUBSTRATES
SYNTHESIS
TEMPERATURE RANGE 0065-0273 K
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
CHALCOGENIDES
CHARGED PARTICLES
CRYSTALS
DEPOSITION
DIELECTRIC PROPERTIES
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPY
EQUIPMENT
FILMS
IONS
IRRADIATION
MAGNETIC RESONANCE
MICROSCOPY
MINERALS
OXIDE MINERALS
OXYGEN COMPOUNDS
PEROVSKITES
PHYSICAL PROPERTIES
RADIATIONS
RESONANCE
SURFACE COATING
TEMPERATURE RANGE