Electrical and luminescence properties of silicon-based tunnel transit-time light-emitting diodes p{sup +}/n{sup +}/n-Si:Er
- Lobachevsky State University, Physicotechnical Research Institute (Russian Federation)
- Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation)
- Lobachevsky State University (Russian Federation)
The electrical and luminescence properties of silicon-based tunnel transit-time light-emitting diodes (LEDs) p{sup +}/n{sup +}/n-Si:Er, emitting under reverse bias on the p{sup +}/n{sup +} junction in the breakdown regime, have been investigated. The room-temperature emission power at the wavelength {lambda} {approx} 1.5 {mu}m ({approx}5 {mu}W), external quantum efficiency ({approx}10{sup -5}), and excitation efficiency of erbium ions ({approx}2 x 10{sup -20} cm{sup 2} s) have been determined. At the same excitation efficiency, tunnel transit-time LEDs exhibit higher emission power in comparison with p{sup +}/n-Si:Er diode structures. The experimental results are compared with the model predictions for these structures. The factors limiting the electroluminescence intensity and impact excitation efficiency for erbium ions in tunnel transit-time LEDs are discussed.
- OSTI ID:
- 21562175
- Journal Information:
- Semiconductors, Vol. 44, Issue 11; Other Information: DOI: 10.1134/S1063782610110217; Copyright (c) 2010 Pleiades Publishing, Ltd.; ISSN 1063-7826
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
BREAKDOWN
COMPARATIVE EVALUATIONS
ELECTROLUMINESCENCE
ERBIUM IONS
EXCITATION
FORECASTING
LIGHT EMITTING DIODES
NITROGEN IONS
PHOSPHORUS IONS
QUANTUM EFFICIENCY
SILICON
TEMPERATURE RANGE 0273-0400 K
WAVELENGTHS
CHARGED PARTICLES
EFFICIENCY
ELEMENTS
EMISSION
ENERGY-LEVEL TRANSITIONS
EVALUATION
IONS
LUMINESCENCE
PHOTON EMISSION
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMIMETALS
TEMPERATURE RANGE