Ultimate photovoltage in perovskite oxide heterostructures with critical film thickness

Journal Article · Mon May 02 00:00:00 EDT 2011 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3586250· OSTI ID:21518413

Cong, Wang; Kuijuan, Jin; Ruiqiang, Zhao; Huibin, Lu; Haizhong, Guo; Chen, Ge; Meng, He; Can, Wang; Guozhen, Yang ^[1]

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1. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 (China)

One order larger photovoltage is obtained with critical thicknesses of La{sub 0.9}Sr{sub 0.1}MnO{sub 3} films in both kinds of heterostructures of La{sub 0.9}Sr{sub 0.1}MnO{sub 3}/SrTiO{sub 3} (0.8 wt % Nb-doped) and La{sub 0.9}Sr{sub 0.1}MnO{sub 3}/Si fabricated at various oxygen pressures. Our self-consistent calculation reveals that the critical thickness of the La{sub 0.9}Sr{sub 0.1}MnO{sub 3} film with the ultimate value of photovoltage is just the thickness of the depletion layer of La{sub 0.9}Sr{sub 0.1}MnO{sub 3} in both heterojunctions, respectively.

• OSTI ID: 21518413
• Journal Information: Applied Physics Letters, Vol. 98, Issue 18; Other Information: DOI: 10.1063/1.3586250; (c) 2011 American Institute of Physics; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DEPLETION LAYER
DOPED MATERIALS
HETEROJUNCTIONS
LANTHANUM COMPOUNDS
MANGANATES
MOLECULAR BEAM EPITAXY
OXIDES
OXYGEN
PEROVSKITE
PHOTOVOLTAIC EFFECT
P-N JUNCTIONS
SEMICONDUCTOR MATERIALS
STRONTIUM COMPOUNDS
STRONTIUM TITANATES
THICKNESS
ALKALINE EARTH METAL COMPOUNDS
CHALCOGENIDES
CRYSTAL GROWTH METHODS
DIMENSIONS
ELEMENTS
EPITAXY
LAYERS
MANGANESE COMPOUNDS
MATERIALS
MINERALS
NONMETALS
OXIDE MINERALS
OXYGEN COMPOUNDS
PEROVSKITES
PHOTOELECTRIC EFFECT
RARE EARTH COMPOUNDS
SEMICONDUCTOR JUNCTIONS
TITANATES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS