Surfactant mediated growth of Ti/Ni multilayers

Journal Article · Mon Mar 07 00:00:00 EST 2011 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3565161· OSTI ID:21518312

Gupta, Mukul; Amir, S M; Gupta, Ajay ^[1]; Stahn, Jochen ^[2]

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1. UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452001 (India)
2. Laboratory for Neutron Scattering, Laboratory for Neutron Scattering, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland)

The surfactant mediated growth of Ti/Ni multilayers is studied. They were prepared using ion beam sputtering at different adatom energies. It was found that the interface roughness decreased significantly when the multilayers were sputtered with Ag as surfactant at an ion energy of 0.75 keV. On the other hand, when the ion energy was increased to 1 keV, it resulted in enhanced intermixing at the interfaces and no appreciable effect of Ag surfactant could be observed. On the basis of the obtained results, the influence of adatom energy on the surfactant mediated growth mechanism is discussed.

• OSTI ID: 21518312
• Journal Information: Applied Physics Letters, Vol. 98, Issue 10; Other Information: DOI: 10.1063/1.3565161; (c) 2011 American Institute of Physics; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DEPOSITION
INTERFACES
ION BEAMS
IONS
LAYERS
NICKEL
ROUGHNESS
SPUTTERING
SURFACTANTS
TITANIUM
BEAMS
CHARGED PARTICLES
ELEMENTS
METALS
SURFACE PROPERTIES
TRANSITION ELEMENTS