IBIXFIT: A Tool For The Analysis Of Microcalorimeter PIXE Spectra

Journal Article · Wed Jun 01 00:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3586103· OSTI ID:21513365

Taborda, A; Reis, M A ^[1]; Alves, L C; Barradas, N P ^[1]; Chaves, P C ^[1]

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1. Instituto Tecnologico e Nuclear, Estrada Nacional 10, Sacavem, Apartado 21, 2686-953 Sacavem (Portugal)

PIXE analysis software has been for long mainly tuned to the needs of Si(Li) detector based spectra analysis and quantification methods based on K{sub {alpha}} or L{sub {alpha}} X-ray lines. Still, recent evidences related to the study of relative line intensities and new developments in detection equipment, namely the emergence of commercial microcalorimeter based X-ray detectors, have brought up the possibility that in the near future PIXE will become more than just major lines quantification. A main issue that became evident as a consequence of this was the need to be able to fit PIXE spectra without prior knowledge of relative line intensities. Considering new developments it may be necessary to generalize PIXE to a wider notion of ion beam induced X-ray (IBIX) emission, to include the quantification of processes such as Radiative Auger Emission. In order to answer to this need, the IBIXFIT code was created based much on the Bayesian Inference and Simulated Annealing routines implemented in the Datafurnace code [1]. In this presentation, the IBIXFIT is used to fit a microcalorimeter spectrum of a Ba{sub x}Sr{sub (1-x)}TiO{sub 3} thin film sample and the specific possibility of selecting between fixed and free line ratios combined with other specificities of the IBIXFIT algorithm are shown to be essential to overcome the problems faced.

• OSTI ID: 21513365
• Journal Information: AIP Conference Proceedings, Vol. 1336, Issue 1; Conference: CAARI 2010: 21. International Conference on the Application of Accelerators in Research and Industry, Fort Worth, TX (United States), 8-13 Aug 2010; Other Information: DOI: 10.1063/1.3586103; (c) 2011 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
ALGORITHMS
ANNEALING
BARIUM COMPOUNDS
EMISSION
ION BEAMS
IONIZATION
LI-DRIFTED SI DETECTORS
PIXE ANALYSIS
SENSORS
SIMULATION
SPECIFICITY
SPECTRA
STRONTIUM COMPOUNDS
THIN FILMS
TITANATES
TITANIUM OXIDES
X RADIATION
X-RAY DETECTION
ALKALINE EARTH METAL COMPOUNDS
BEAMS
CHALCOGENIDES
CHEMICAL ANALYSIS
DETECTION
ELECTROMAGNETIC RADIATION
FILMS
HEAT TREATMENTS
IONIZING RADIATIONS
LI-DRIFTED DETECTORS
MATHEMATICAL LOGIC
MEASURING INSTRUMENTS
NONDESTRUCTIVE ANALYSIS
OXIDES
OXYGEN COMPOUNDS
RADIATION DETECTION
RADIATION DETECTORS
RADIATIONS
SEMICONDUCTOR DETECTORS
SI SEMICONDUCTOR DETECTORS
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
X-RAY EMISSION ANALYSIS