Physical Property of Magnesium Doped Barium Hexaferrite Particles By Citrate Precursor Route In Presence Of Surfactants
Journal Article
·
· AIP Conference Proceedings
- Indus Institute of Technology and Engineering, Rancharda via Thaltej, Ahmedabad-382 115. Gujarat (India)
M-type Barium Magnesium hexaferrite with the composition BaMg{sub 2}Fe{sub 10}O{sub 19} was successfully prepared with and without surfactant by using a citrate precursor route. The obtained precursors were calcined at various temperatures. The crystalline structure, phase analysis and particle size were investigated by using X-ray diffraction (XRD), Fourier Transform infrared spectroscopy (FTIR), Scanning Electron Microscopy (SEM) techniques. It is observed that the surfactant addition controls the microstructure of the formed Barium Magnesium hexaferrite particles and the type of surfactant plays a crucial role in deciding the morphology of particles.
- OSTI ID:
- 21509968
- Journal Information:
- AIP Conference Proceedings, Vol. 1313, Issue 1; Conference: PEFM-2010: International conference on physics of emerging functional materials, Mumbai (India), 22-24 Sep 2010; Other Information: DOI: 10.1063/1.3530531; (c) 2010 American Institute of Physics; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
BARIUM COMPOUNDS
CITRATES
DOPED MATERIALS
FERRITES
FOURIER TRANSFORM SPECTROMETERS
INFRARED SPECTRA
MAGNESIUM ADDITIONS
MICROSTRUCTURE
PARTICLE SIZE
PARTICLES
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
SURFACTANTS
X-RAY DIFFRACTION
ALKALINE EARTH METAL COMPOUNDS
ALLOYS
CARBOXYLIC ACID SALTS
COHERENT SCATTERING
DIFFRACTION
ELECTRON MICROSCOPY
FERRIMAGNETIC MATERIALS
IRON COMPOUNDS
MAGNESIUM ALLOYS
MAGNETIC MATERIALS
MATERIALS
MEASURING INSTRUMENTS
MICROSCOPY
OXYGEN COMPOUNDS
SCATTERING
SIZE
SPECTRA
SPECTROMETERS
TRANSITION ELEMENT COMPOUNDS
BARIUM COMPOUNDS
CITRATES
DOPED MATERIALS
FERRITES
FOURIER TRANSFORM SPECTROMETERS
INFRARED SPECTRA
MAGNESIUM ADDITIONS
MICROSTRUCTURE
PARTICLE SIZE
PARTICLES
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
SURFACTANTS
X-RAY DIFFRACTION
ALKALINE EARTH METAL COMPOUNDS
ALLOYS
CARBOXYLIC ACID SALTS
COHERENT SCATTERING
DIFFRACTION
ELECTRON MICROSCOPY
FERRIMAGNETIC MATERIALS
IRON COMPOUNDS
MAGNESIUM ALLOYS
MAGNETIC MATERIALS
MATERIALS
MEASURING INSTRUMENTS
MICROSCOPY
OXYGEN COMPOUNDS
SCATTERING
SIZE
SPECTRA
SPECTROMETERS
TRANSITION ELEMENT COMPOUNDS