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Title: Surface damages in diamond by Ar/O{sub 2} plasma and their effect on the electrical and electrochemical characteristics of boron-doped layers

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3489986· OSTI ID:21476522
; ; ;  [1];  [2]
  1. Institute of Electron Devices and Circuits, University of Ulm, 89069 Ulm (Germany)
  2. Institute of Physics, University of Basel, 4056 Basel (Switzerland)

Epitaxial single crystal and boron-doped diamond layers were exposed to reactive ion etching in Ar/O{sub 2} plasma (rf power of 25 W and self-bias of 100 V); and the electrical, structural, and electrochemical characteristics of the exposed surface were investigated. Angle-resolved x-ray photoemission spectroscopy (XPS) measurements revealed a nonuniform layer of amorphous carbon at the exposed surface with an average thickness of approximately 4 nm, as confirmed also by atomic force microscopy profiling of selectively etched areas. On highly boron-doped diamond, the plasma-induced damages resulted also in a nonconductive surface layer. This damaged and insulating surface layer remained resistant to graphite-etching chemicals and to rf oxygen plasma but it was removed completely in microwave hydrogen plasma at 700 deg. C. The surface characteristics after the H-plasma process followed by wet chemical oxidation were restored back to the initial state, as confirmed by XPS. Such ''recovery'' treatment had been applied to an all-diamond submicrometer electrode array initially patterned by an Ar/O{sub 2} plasma etching. The electrochemical characteristics of this electrode array were improved by more than two orders of magnitude, approaching theoretical limit for the given geometrical configuration.

OSTI ID:
21476522
Journal Information:
Journal of Applied Physics, Vol. 108, Issue 7; Other Information: DOI: 10.1063/1.3489986; (c) 2010 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English