Finite element analysis of the effect of electrodes placement on accurate resistivity measurement in a diamond anvil cell with van der Pauw technique

Journal Article · Sat May 15 00:00:00 EDT 2010 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3374466· OSTI ID:21476273

Baojia, Wu ^[1]; Xiaowei, Huang; Yonghao, Han; Chunxiao, Gao; Gang, Peng; Cailong, Liu; Yue, Wang; Xiaoyan, Cui; Guangtian, Zou ^[1]

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1. National Laboratory of Superhard Materials, Jilin University, Changchun, Jilin 130012 (China)

The van der Pauw technique is widely used to determine resistivity of materials. In diamond anvil cell the compressed sample will make the contact placement change under high pressure. Using finite element analysis, we study the effect of contact placement error induced by pressure on the resistivity measurement accuracy of van der Pauw method. The results show the contact placement has a significant effect on determination accuracy. This method can provide accurate determination of sample resistivity when the spacing b between the contact center and sample periphery is less than D/9 (sample diameter). And the effect of contact placement error on accuracy rapidly increases as the contact location is closing to the sample center. For the same contact placement, the contact size error has a more obvious effect on the semiconductor sample.

• OSTI ID: 21476273
• Journal Information: Journal of Applied Physics, Vol. 107, Issue 10; Other Information: DOI: 10.1063/1.3374466; (c) 2010 American Institute of Physics; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ACCURACY
DIAMONDS
ELECTRIC CONDUCTIVITY
ELECTRODES
ERRORS
FINITE ELEMENT METHOD
MEASURING METHODS
PRESSURE DEPENDENCE
SEMICONDUCTOR MATERIALS
CALCULATION METHODS
CARBON
ELECTRICAL PROPERTIES
ELEMENTS
MATERIALS
MATHEMATICAL SOLUTIONS
MINERALS
NONMETALS
NUMERICAL SOLUTION
PHYSICAL PROPERTIES