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Title: Ultrasmall particle detection using a submicron Hall sensor

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3360584· OSTI ID:21476229
;  [1];  [1];  [1];  [1];  [2];  [3]
  1. National Physical Laboratory, Teddington TW11 0LW (United Kingdom)
  2. Center for Nanointegration, University of Duisburg-Essen, Duisburg 47048 (Germany)
  3. Imperial College London, London SW7 2BW (United Kingdom)

We demonstrate detection of a single FePt nanoparticle (diameter 150 nm, moment {approx}10{sup 7} {mu}{sub B}) using an ultrasensitive InSb Hall sensor with the bar lateral width of 600 nm. The white noise of a typical nanodevice, S{sub V}{sup 1/2{approx_equal}}28 nV/{radical}Hz, is limited only by two-terminal resistance of the voltage leads which results in a minimum field sensitivity of the device B{sub min}=0.87 {mu}T/{radical}Hz. To detect a single FePt bead, we employed a phase-sensitive method based on measuring the ac susceptibility change in a bead when exposed to a switched dc magnetic field. Such nano-Hall devices, enabling detection of potentially even smaller moments, are of considerable significance both for nanomagnetic metrology and high sensitivity biological and environmental detectors.

OSTI ID:
21476229
Journal Information:
Journal of Applied Physics, Vol. 107, Issue 9; Conference: 11. joint MMM-Intermag conference, Washington, DC (United States), 18-22 Jan 2010; Other Information: DOI: 10.1063/1.3360584; (c) 2010 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English