Structural characterization of metastable hcp-Ni thin films epitaxially grown on Au(100) single-crystal underlayers
Journal Article
·
· Journal of Applied Physics
- Faculty of Science and Engineering, Chuo University, Bunkyo-ku, Tokyo 112-8551 (Japan)
- Graduate School of Fine Arts, Tokyo National University of Fine Arts and Music, Taito-ku, Tokyo 110-8714 (Japan)
Ni(1120) epitaxial thin films with hcp structure were prepared on Au(100) single-crystal underlayers at 100 deg. C by ultra high vacuum molecular beam epitaxy. The detailed film structure is studied by in situ reflection high energy electron diffraction, x-ray diffraction, and transmission electron microscopy. The hcp-Ni film consists of two types of variants whose c-axes are rotated around the film normal by 90 deg. each other. An atomically sharp boundary is recognized between the film and the underlayer, where misfit dislocations are introduced. Presence of such dislocations seems to relieve the strain caused by the lattice mismatch between the film and the underlayer.
- OSTI ID:
- 21476226
- Journal Information:
- Journal of Applied Physics, Vol. 107, Issue 9; Conference: 11. joint MMM-Intermag conference, Washington, DC (United States), 18-22 Jan 2010; Other Information: DOI: 10.1063/1.3360198; (c) 2010 American Institute of Physics; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL GROWTH
DISLOCATIONS
ELECTRON DIFFRACTION
GOLD
HCP LATTICES
LAYERS
MOLECULAR BEAM EPITAXY
MONOCRYSTALS
NICKEL
REFLECTION
STRAINS
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
VACUUM COATING
X-RAY DIFFRACTION
COHERENT SCATTERING
CRYSTAL DEFECTS
CRYSTAL GROWTH METHODS
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CRYSTALS
DEPOSITION
DIFFRACTION
ELECTRON MICROSCOPY
ELEMENTS
EPITAXY
FILMS
HEXAGONAL LATTICES
LINE DEFECTS
METALS
MICROSCOPY
SCATTERING
SURFACE COATING
TRANSITION ELEMENTS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL GROWTH
DISLOCATIONS
ELECTRON DIFFRACTION
GOLD
HCP LATTICES
LAYERS
MOLECULAR BEAM EPITAXY
MONOCRYSTALS
NICKEL
REFLECTION
STRAINS
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
VACUUM COATING
X-RAY DIFFRACTION
COHERENT SCATTERING
CRYSTAL DEFECTS
CRYSTAL GROWTH METHODS
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CRYSTALS
DEPOSITION
DIFFRACTION
ELECTRON MICROSCOPY
ELEMENTS
EPITAXY
FILMS
HEXAGONAL LATTICES
LINE DEFECTS
METALS
MICROSCOPY
SCATTERING
SURFACE COATING
TRANSITION ELEMENTS