Chemical vapor deposition diamond based multilayered radiation detector: Physical analysis of detection properties
- Dip. di Ing. Meccanica, Universita di Roma 'Tor Vergata', Roma 00133 (Italy)
- Associazione EURATOM-ENEA sulla Fusione, Frascati, Roma 00044 (Italy)
- Diamond Light Source, Harwell Science and Innovation Campus, Chilton-Didcot, OX11 0DE Oxfordshire (United Kingdom)
Recently, solid state photovoltaic Schottky diodes, able to detect ionizing radiation, in particular, x-ray and ultraviolet radiation, have been developed at the University of Rome 'Tor Vergata'. We report on a physical and electrical properties analysis of the device and a detailed study of its detection capabilities as determined by its electrical properties. The design of the device is based on a metal/nominally intrinsic/p-type diamond layered structure obtained by microwave plasma chemical vapor deposition of homoepitaxial single crystal diamond followed by thermal evaporation of a metallic contact. The device can operate in an unbiased mode by using the built-in potential arising from the electrode-diamond junction. We compare the expected response of the device to photons of various energies calculated through Monte Carlo simulation with experimental data collected in a well controlled experimental setup i.e., monochromatic high flux x-ray beams from 6 to 20 keV, available at the Diamond Light Source synchrotron in Harwell (U.K.).
- OSTI ID:
- 21476089
- Journal Information:
- Journal of Applied Physics, Vol. 107, Issue 1; Other Information: DOI: 10.1063/1.3275501; (c) 2010 American Institute of Physics; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHEMICAL VAPOR DEPOSITION
COMPARATIVE EVALUATIONS
COMPUTERIZED SIMULATION
DIAMONDS
ELECTRICAL PROPERTIES
EPITAXY
IONIZATION CHAMBERS
LAYERS
MONOCRYSTALS
MONTE CARLO METHOD
PHOTODETECTORS
RESPONSE FUNCTIONS
SCINTILLATION COUNTERS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR MATERIALS
SOLIDS
X-RAY DETECTION
CALCULATION METHODS
CARBON
CHEMICAL COATING
CRYSTAL GROWTH METHODS
CRYSTALS
DEPOSITION
DETECTION
ELEMENTS
EVALUATION
FUNCTIONS
MATERIALS
MEASURING INSTRUMENTS
MINERALS
NONMETALS
PHYSICAL PROPERTIES
RADIATION DETECTION
RADIATION DETECTORS
SIMULATION
SURFACE COATING