On the Sn loss from thin films of the material system Cu-Zn-Sn-S in high vacuum

Journal Article · Fri Jan 15 00:00:00 EST 2010 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3273495· OSTI ID:21476078

Weber, A; Mainz, R; Schock, H W ^[1]

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1. Helmholtz-Zentrum Berlin fuer Materialien und Energie, Glienicker Str. 100, D-14109 Berlin (Germany)

In this paper the Sn loss from thin films of the material system Cu-Zn-Sn-S and the subsystems Cu-Sn-S and Sn-S in high vacuum is investigated. A combination of in situ x-ray diffractometry and x-ray fluorescence (XRF) at a synchrotron light source allowed identifying phases, which tend to decompose and evaporate a Sn-containing compound. On the basis of the XRF results a quantification of the Sn loss from the films during annealing experiments is presented. It can be shown that the evaporation rate from the different phases decreases according to the order SnS{yields}Cu{sub 2}SnS{sub 3}{yields}Cu{sub 4}SnS{sub 4}{yields}Cu{sub 2}ZnSnS{sub 4}. The phase SnS is assigned as the evaporating compound. The influence of an additional inert gas component on the Sn loss and on the formation of Cu{sub 2}ZnSnS{sub 4} thin films is discussed.

• OSTI ID: 21476078
• Journal Information: Journal of Applied Physics, Vol. 107, Issue 1; Other Information: DOI: 10.1063/1.3273495; (c) 2010 American Institute of Physics; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ANNEALING
COPPER COMPOUNDS
EVAPORATION
LOSSES
PHASE STABILITY
PHASE STUDIES
SEMICONDUCTOR MATERIALS
THIN FILMS
TIN
TIN SULFIDES
VACUUM COATING
X-RAY DIFFRACTION
X-RAY FLUORESCENCE ANALYSIS
ZINC COMPOUNDS
CHALCOGENIDES
CHEMICAL ANALYSIS
COHERENT SCATTERING
DEPOSITION
DIFFRACTION
ELEMENTS
FILMS
HEAT TREATMENTS
MATERIALS
METALS
NONDESTRUCTIVE ANALYSIS
PHASE TRANSFORMATIONS
SCATTERING
STABILITY
SULFIDES
SULFUR COMPOUNDS
SURFACE COATING
TIN COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
X-RAY EMISSION ANALYSIS