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Title: Measurement of thermal conductivity of polycrystalline CVD diamond by laser-induced transient grating technique

Journal Article · · Quantum Electronics (Woodbury, N.Y.)
;  [1]; ;  [2];  [3]
  1. B.I. Stepanov Institute of Physics, National Academy of Sciences of Belarus, Minsk (Belarus)
  2. Natural Science Center, A.M. Prokhorov General Physics Institute, Russian Academy of Sciences, Moscow (Russian Federation)
  3. Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow (Russian Federation)

The tangential thermal diffusivity D{sub ||} and thermal conductivity k{sub ||} of diamond plates grown from the gaseous phase by chemical vapour deposition (CVD diamond) are determined by the transient grating technique in the temperature range 25 - 200 {sup 0}C. Samples of insulating and boron-doped polycrystalline diamond of thickness about 0.3 mm and diameter 63 mm were synthesised in a microwave discharge in mixtures of methane and hydrogen. In view of the intense light scattering by the samples, a photosensitive grating recording technique was developed and used for measurements. It was found that the value k{sub ||} amounts to 18 - 20 W cm{sup -1} K{sup -1} at room temperature, approaching the thermal conductivity of the highest purity single crystals of diamond. A comparison of the value of k{sub ||} with the normal thermal conductivity k{sub perpendicular} determined by the flash method reveals a thermal conductivity anisotropy of about 10% - 20% associated with the texture of the diamond film, the normal component of thermal conductivity being larger than the tangential component. Boron-doped diamond displays a dependence of the transient grating kinetics on the excitation wavelength. The obtained results indicate that CVD diamond is a promising material for preparing efficient heat sinks, especially of large size, used in microelectronic devices and laser engineering. (laser applications and other topics in quantum electronics)

OSTI ID:
21454780
Journal Information:
Quantum Electronics (Woodbury, N.Y.), Vol. 32, Issue 4; Other Information: DOI: 10.1070/QE2002v032n04ABEH002200; ISSN 1063-7818
Country of Publication:
United States
Language:
English