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Title: Accounting for water-column variability in shallow-water waveguide characterizations based on modal eigenvalues

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3493103· OSTI ID:21436005
 [1];  [2]
  1. Pennsylvania State University, Applied Research Laboratory, P.O. Box 30, State College, PA 16804-0030 (United States)
  2. Applied Research Laboratories, University of Texas at Austin, Austin, TX 78713-8029 (United States)

The influence of water-column variability on the characterization of shallow-water waveguides using modal eigenvalue information is considered. This work is based on the relationship between the acoustic pressure field in shallow water and the depth-dependent Green's function through the Hankel transform. In many practical situations, the Hankel transform can be approximated by a Fourier transform, in which case the Green's function is approximated by a horizontal wave number spectrum with discrete peaks corresponding with individual modal eigenvalues. In turn, the wave number data can be used in inverse algorithms to determine geoacoustic properties of the waveguide. Wave number spectra are estimated from measurements of a point-source acoustic field on a horizontal aperture array in the water column. For range-dependent waveguides, techniques analogous to using a short-time Fourier transform are employed to estimate range-dependent wave number spectra. In this work, water-column variability due to linear internal waves and mesoscale features are considered. It will be shown that these two types of variability impact the estimation of range-dependent modal eigenvalues in different ways. Approaches for accounting for these different types of variability will be discussed as they apply to waveguide characterization.

OSTI ID:
21436005
Journal Information:
AIP Conference Proceedings, Vol. 1272, Issue 1; Conference: SWAC'09: 2. international shallow-water acoustics conference, Shanghai (China), 16-20 Sep 2009; Other Information: DOI: 10.1063/1.3493103; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English