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Title: Breaking the Attosecond, Angstrom and TV/m Field Barriers with Ultrafast Electron Beams

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3520371· OSTI ID:21428820
; ; ; ; ; ; ; ; ; ; ;  [1]; ; ;  [2];  [3];  [4]
  1. UCLA Dept. of Physics and Astronomy, 405 Hilgard Ave. Los Angeles, CA 90095 (United States)
  2. Stanford Linear Accelerator Center, 2575 Sand Hill Rd., Menlo Park, CA 94025 (United States)
  3. Acclerator Division, Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali di Frascati, Via E. Fermi 40, Frascati 00044 (Italy)
  4. University of Southern California, Los Angeles, California 90089 (United States)

Recent initiatives at UCLA concerning ultra-short, GeV electron beam generation have been aimed at achieving sub-fs pulses capable of driving X-ray free-electron lasers (FELs) in single-spike mode. This scheme uses very low charge beams, which may allow existing FEL injectors to produce few-100 attosecond pulses, with very high brightness. Towards this end, recent experiments at the Stanford X-ray FEL (LCLS, first of its kind, built with essential UCLA leadership) have produced {approx}2 fs, 20 pC electron pulses. We discuss here extensions of this work, in which we seek to exploit the beam brightness in FELs, in tandem with new developments at UCLA in cryogenic undulator technology, to create compact accelerator/undulator systems that can lase below 0.15 Angst , or be used to permit 1.5 Angst operation at 4.5 GeV. In addition, we are now developing experiments which use the present LCLS fs pulses to excite plasma wakefields exceeding 1 TV/m, permitting a table-top TeV accelerator for frontier high energy physics applications. We discuss the experimental issues associated with this initiative.

OSTI ID:
21428820
Journal Information:
AIP Conference Proceedings, Vol. 1299, Issue 1; Conference: 14. advanced accelerator concepts workshop, Annapolis, MD (United States), 13-19 Jun 2010; Other Information: DOI: 10.1063/1.3520371; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English