Performance measurements at the SLS SIM beamline

Journal Article · Wed Jun 23 00:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3463200· OSTI ID:21410241

Flechsig, U; Nolting, F; Fraile Rodriguez, A; Krempasky, J; Quitmann, C; Schmidt, T; Spielmann, S; Zimoch, D ^[1]

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1. Paul Scherrer Institut, Swiss Light Source, 5232 Villigen PSI (Switzerland)

The Surface/Interface: Microscopy beamline of the Swiss Light Source started operation in 2001. In 2007 the beamline has been significantly upgraded with a second refocusing section and a blazed grating optimized for high photon flux. Two Apple II type undulators with a plane grating monochromator using the collimated light scheme deliver photons with an energy from 90eV to about 2keV with variable polarization for the photoemission electron microscope (PEEM) as the primary user station. We measured a focus of (45x60) {mu}m({nu}xh) and a photon flux > 10{sup 12} photon/s for all gratings. Polarization switching within a few seconds is realized with the small bandpass of the monochromator and a slight detuning of the undulator.

• OSTI ID: 21410241
• Journal Information: AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463200; (c) 2010 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
APPLES
ELECTRON MICROSCOPES
EMISSION SPECTROSCOPY
GRATINGS
MONOCHROMATORS
PHOTOELECTRON SPECTROSCOPY
PHOTOEMISSION
PHOTONS
POLARIZATION
SWISS LIGHT SOURCE
SYNCHROTRON RADIATION
WIGGLER MAGNETS
X RADIATION
BOSONS
BREMSSTRAHLUNG
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTARY PARTICLES
EMISSION
EQUIPMENT
FOOD
FRUITS
IONIZING RADIATIONS
MAGNETS
MASSLESS PARTICLES
MICROSCOPES
RADIATION SOURCES
RADIATIONS
SECONDARY EMISSION
SPECTROSCOPY
SYNCHROTRON RADIATION SOURCES