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Title: Spin glass transitions in the absence of chemical disorder for the pyrochlores A{sub 2}Sb{sub 2}O{sub 7} (A=Mn, Co, Ni)

Journal Article · · Journal of Solid State Chemistry
 [1];  [1];  [2]; ;  [3];  [4]
  1. Department of Physics, Florida State University, Tallahassee, FL 32306-3016 (United States)
  2. National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL 32306-4005 (United States)
  3. Department of Chemistry, Florida State University, Tallahassee, FL 32306-4390 (United States)
  4. Indiana University, 2401 Milo B. Sampson Lane, Bloomington, IN 47408 (United States)

The pyrochlores in the series A{sub 2}Sb{sub 2}O{sub 7} have been synthesized and characterized as exhibiting spin glass transitions at T{sub SG}=41, 4.5, and 2.6 K (for A=Mn{sup 2+}S=5/2 , Co{sup 2+}S=3/2 and Ni{sup 2+}S=1, respectively) despite the lack of chemical disorder. Since the Curie-Weiss temperature remains essentially constant for all members in the series ({theta}{approx}-40K), the frustration index for these materials increases significantly as the moment size is reduced from f=|theta|/T{sub SG}=1.1 (Mn{sup 2+}), to 9.3 (Co{sup 2+}) to 14.6 (Ni{sup 2+}). There is also a corresponding change in the spin dynamics measured by the shift in the AC susceptibility signal as a function of frequency. These new materials provide an avenue to investigate the effect of quantum fluctuations on the Heisenberg pyrochlore lattice in the low spin limit, and show there is a dramatic change in the spin dynamics as the quantum regime is approached. - A comparison of the spin glass ordering temperature, T{sub SG}, and the frustration index f as a function of the spin for the pyrochlore series A{sub 2}Sb{sub 2}O{sub 7}. In the limit of low spin, the frustration index increases by an order of magnitude.

OSTI ID:
21372568
Journal Information:
Journal of Solid State Chemistry, Vol. 183, Issue 4; Other Information: DOI: 10.1016/j.jssc.2010.01.025; PII: S0022-4596(10)00039-3; Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; ISSN 0022-4596
Country of Publication:
United States
Language:
English