Wavelength and Intensity Dependence of Short Pulse Laser Xenon Double Ionization between 500 and 2300 nm

Journal Article · Fri Oct 23 00:00:00 EDT 2009 · Physical Review Letters

DOI:https://doi.org/10.1103/PHYSREVLETT.103.173001· OSTI ID:21370782

Gingras, G; Tripathi, A; Witzel, B ^[1]

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1. Centre d'Optique, Photonique et Laser, Universite Laval, Pavillon d'optique-photonique Quebec (Quebec), G1V 0A6 (Canada)

The wavelength and intensity dependence of xenon ionization with 50 fs laser pulses has been studied using time-of-flight mass spectrometry. We compare the ion yield distribution of singly and doubly charged xenon with the Perelomov-Popov-Terent'ev (PPT) theory, Perelomov, Popov, and Terent'ev, Zh. Eksp. Teor. Fiz. 50, 1393 (1966) [Sov. Phys. JETP 23, 924 (1966)], in the regime between 500 and 2300 nm. The intensity dependence for each wavelength is measured in a range between 1x10{sup 13} and 1x10{sup 15} W/cm{sup 2}. The Xe{sup +}-ion signal is in good agreement with the PPT theory at all used wavelengths. In addition we demonstrate that ionic 5s5p{sup 6} {sup 2}S state is excited by an electron impact excitation process and contributes to the nonsequential double ionization process.

• OSTI ID: 21370782
• Journal Information: Physical Review Letters, Vol. 103, Issue 17; Other Information: DOI: 10.1103/PhysRevLett.103.173001; (c) 2009 The American Physical Society; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRONS
EXCITATION
IONIZATION
LASERS
MASS SPECTROSCOPY
PULSES
SIGNALS
TIME-OF-FLIGHT METHOD
WAVELENGTHS
XENON
XENON IONS
CHARGED PARTICLES
ELEMENTARY PARTICLES
ELEMENTS
ENERGY-LEVEL TRANSITIONS
FERMIONS
FLUIDS
GASES
IONS
LEPTONS
NONMETALS
RARE GASES
SPECTROSCOPY