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Title: Tailoring a plasma focus as hard x-ray source for imaging

Abstract

An investigation on temporal and spatial properties of hard x-rays (15-88 keV) emitted in a 5.3 kJ plasma focus using Si pin diodes and a pinhole camera is reported. The maximum yield of hard x-rays of 15-88 keV range is estimated about 4.7 J and corresponding efficiency for x-ray generation is 0.09%. The x-rays with energy >15 keV have 15-20 ns pulse duration and approx1 mm source size. This radiation is used for contact x-ray imaging of biological and compound objects and spatial resolution of approx50 mum is demonstrated.

Authors:
 [1]; ;  [2]
  1. Department of Physics, University of Sargodha, 40100 Sargodha (Pakistan)
  2. Department of Physics, Quaid-i-Azam University, 45320 Islamabad (Pakistan)
Publication Date:
OSTI Identifier:
21347243
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 96; Journal Issue: 3; Other Information: DOI: 10.1063/1.3291039; (c) 2010 American Institute of Physics; Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CAMERAS; HARD X RADIATION; KEV RANGE 10-100; PLASMA; PLASMA FOCUS; PULSES; SPATIAL RESOLUTION; X-RAY SOURCES; ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; RADIATION SOURCES; RADIATIONS; RESOLUTION; X RADIATION

Citation Formats

Hussain, S, Shafiq, M, and Zakaullah, M. Tailoring a plasma focus as hard x-ray source for imaging. United States: N. p., 2010. Web. doi:10.1063/1.3291039.
Hussain, S, Shafiq, M, & Zakaullah, M. Tailoring a plasma focus as hard x-ray source for imaging. United States. https://doi.org/10.1063/1.3291039
Hussain, S, Shafiq, M, and Zakaullah, M. 2010. "Tailoring a plasma focus as hard x-ray source for imaging". United States. https://doi.org/10.1063/1.3291039.
@article{osti_21347243,
title = {Tailoring a plasma focus as hard x-ray source for imaging},
author = {Hussain, S and Shafiq, M and Zakaullah, M},
abstractNote = {An investigation on temporal and spatial properties of hard x-rays (15-88 keV) emitted in a 5.3 kJ plasma focus using Si pin diodes and a pinhole camera is reported. The maximum yield of hard x-rays of 15-88 keV range is estimated about 4.7 J and corresponding efficiency for x-ray generation is 0.09%. The x-rays with energy >15 keV have 15-20 ns pulse duration and approx1 mm source size. This radiation is used for contact x-ray imaging of biological and compound objects and spatial resolution of approx50 mum is demonstrated.},
doi = {10.1063/1.3291039},
url = {https://www.osti.gov/biblio/21347243}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 3,
volume = 96,
place = {United States},
year = {Mon Jan 18 00:00:00 EST 2010},
month = {Mon Jan 18 00:00:00 EST 2010}
}