Lifetime statistics in chaotic dielectric microresonators

Journal Article · Fri May 15 00:00:00 EDT 2009 · Physical Review. A

DOI:https://doi.org/10.1103/PHYSREVA.79.053806· OSTI ID:21313082

Schomerus, Henning; Wiersig, Jan; Main, Joerg ^[1]

---

1. Department of Physics, Lancaster University, Lancaster LA1 4YB (United Kingdom)

We discuss the statistical properties of lifetimes of electromagnetic quasibound states in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance-trapping phenomen0008.

• OSTI ID: 21313082
• Journal Information: Physical Review. A, Vol. 79, Issue 5; Other Information: DOI: 10.1103/PhysRevA.79.053806; (c) 2009 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BOUND STATE
DIELECTRIC MATERIALS
FRACTALS
GEOMETRY
LIFETIME
QUASIBOUND STATE
RANDOMNESS
RENORMALIZATION
RESONANCE
RESONATORS
STATISTICS
TRAPPING