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Title: Surface x-ray diffraction of complex metal oxide surfaces and interfaces--a new era

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3086245· OSTI ID:21260241
; ; ; ; ;  [1]; ;  [2];  [3]
  1. Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen (Switzerland)
  2. Randall Laboratory of Physics and FOCUS Center, University of Michigan, Ann Arbor, Michigan, 48109-1120 (United States)
  3. Racah Institute of Physics, Hebrew University, Jerusalem, 91904 (Israel)

The availability of high-brilliance hard x-ray synchrotron radiation and the advent of novel photon counting area detectors have brought surface x-ray diffraction (SXRD) into a new era. It is now possible to record large numbers of structure factors with much improved reliability within reasonable beamtime durations. As a result, structural determination of the surfaces and interfaces of complex crystallographic systems and heterostructures has now become feasible, especially in conjunction with phase-retrieval methods. It is thereby hoped that detailed structural information will shed light on the unusual physical properties of these systems. Complex metal oxide systems investigated at the Materials Science beamline of the Swiss Light Source, including the surface of SrTiO{sub 3}, the interface between LaAlO{sub 3} and SrTiO{sub 3}, and the structure of YBa{sub 2}Cu{sub 3}O{sub 7} grown on NdGaO{sub 3}, SrTiO{sub 3}, and (LaSr)(AlTa)O{sub 3} will be presented as examples of what is now possible using SXRD.

OSTI ID:
21260241
Journal Information:
AIP Conference Proceedings, Vol. 1092, Issue 1; Conference: 6. international conference on synchrotron radiation in materials science, Campinas (Brazil), 20-23 Jul 2008; Other Information: DOI: 10.1063/1.3086245; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English