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Title: AlGaN-based quantum-well heterostructures for deep ultraviolet light-emitting diodes grown by submonolayer discrete plasma-assisted molecular-beam epitaxy

Journal Article · · Semiconductors
; ; ; ; ;  [1]; ; ; ;  [2]
  1. Russian Academy of Sciences, Ioffe Physico-Technical Institute (Russian Federation)
  2. National Academy of Sciences of Belarus, Stepanov Institute of General Physics (Belarus)

Features of plasma-assisted molecular-beam epitaxy of AlGaN compounds at relatively low temperatures of the substrate (no higher than 740 deg. C) and various stoichiometric conditions for growth of the nitrogen- and metal-enriched layers are studied. Discrete submonolayer epitaxy for formation of quantum wells and n-type blocking layers without varying the fluxes of components was used for the first time in the case of molecular- beam epitaxy with plasma activation of nitrogen for the nanostructures with the Al{sub x}Ga{sub 1-x}N/Al{sub y}Ga{sub 1-y}N quantum wells. Structural and optical properties of the Al{sub x}Ga{sub 1-x}N layers in the entire range of compositions (x = 0-1) and nanostructures based on these layers are studied; these studies indicate that there is photoluminescence at room temperature with minimum wavelength of 230 nm. Based on the analysis of the photoluminescence spectra for bulk layers and nanoheterostructures and their temperature dependences, it is concluded that there are localized states in quantum wells. Using the metal-enriched layers grown on the c-Al{sub 2}O{sub 3} substrates, heterostructures for light-emitting diodes with Al{sub x}Ga{sub 1-x}N/Al{sub y}Ga{sub 1-y}N quantum wells (x = 0.4-0.5, y = x + 0.15) were obtained and demonstrated electroluminescence in the ultraviolet region of the spectrum at the wavelength of 320 nm.

OSTI ID:
21255586
Journal Information:
Semiconductors, Vol. 42, Issue 12; Other Information: DOI: 10.1134/S1063782608120099; Copyright (c) 2008 Pleiades Publishing, Ltd; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7826
Country of Publication:
United States
Language:
English