Precision Measurements of the 278 keV {sup 14}N(p,{gamma}) and the 151 keV {sup 18}O(p,{alpha}) Resonance Parameters
- II. Physikalisches Institut, Georg-August-Universitaet Goettingen, Friedrich-Hund-Platz 1, 37077 Goettingen (Germany)
- Institut fuer Halbleiteroptik und Funktionelle Grenzflaechen, Universitaet Stuttgart, 70569 Stuttgart (Germany)
In thin film technology, analytical methods for monitoring the deposition of oxide and nitride coatings and the effects of corrosive, laser and ion-beam treatments have attracted considerable attention. For depth-profiling the concentrations of light isotopes, resonant nuclear reaction analysis is an excellent non-destructive ion-beam analytical tool. We report here on precision measurements of the 278 keV {sup 14}N(p,{gamma}) and the 151 keV {sup 18}O(p,{alpha}) resonances using the high-resolution proton beam of the Goettingen IONAS accelerator. The deduced resonance energies E{sub R} and total widths {gamma}(in the laboratory system) are E{sub R} = 277.60(27) keV and {gamma} = 1115(33) eV for the {sup 14}N(p,{gamma}) resonance, and E{sub R} = 150.97(26) keV and {gamma} = 178(35) eV for the {sup 18}O(p,{alpha}) resonance. These values are significantly more precise than the ones quoted in the literature.
- OSTI ID:
- 21255459
- Journal Information:
- AIP Conference Proceedings, Vol. 1090, Issue 1; Conference: 13. international symposium on capture gamma-ray spectroscopy and related topics, Cologne (Germany), 25-29 Aug 2008; Other Information: DOI: 10.1063/1.3087064; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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