Simulation Study of Single Photon Emission Computed Tomography for Industrial Applications
- Laser and Neutron Physics Section, Bhabha Atomic Research Centre, Mumbai (India)
SPECT (Single Photon Emission Computed Tomography) provides for an invaluable non-invasive technique for the characterization and activity distribution of the gamma-emitting source. For many applications of radioisotopes for medical and industrial application, not only the positional information of the distribution of radioisotopes is needed but also its strength. The well-established X-ray radiography or transmission tomography techniques do not yield sufficient quantitative information about these objects. Emission tomography is one of the important methods for such characterization. Application of parallel beam, fan beam and 3D cone beam emission tomography methods have been discussed in this paper. Simulation studies to test these algorithms have been carried out to validate the technique.
- OSTI ID:
- 21251425
- Journal Information:
- AIP Conference Proceedings, Vol. 1050, Issue 1; Conference: CT2008 tomography confluence: international conference on the applications of computerized tomography, Kanpur (India), 15-17 Feb 2009; Other Information: DOI: 10.1063/1.2999996; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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