Microbeam AMS for Trace Element and Isotopic Studies

Journal Article · Thu Jun 10 00:00:00 EDT 1999 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.59207· OSTI ID:21208030

Sie, S H; Sims, D A; Bruhn, F; Suter, G F; Niklaus, T R ^[1]

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1. Heavy Ion Analytical Facility, CSIRO Division of Exploration and Mining, P.O. Box 136, North Ryde, NSW 2113 (Australia)

A microbeam Accelerator Mass Spectrometry (AMS) system has been developed at the CSIRO Heavy Ion Analytical Facility (HIAF) in Sydney, known as AUSTRALIS: A.M.S. for Ultra Sensitive TRAce eLement and Isotopic Studies. Based on a 3MV Tandetron, the system is designed for in-situ micro analysis of geological samples by mass spectrometric method virtually unrestricted by molecular and isobaric interferences. The microbeam source was developed from a HICONEX source, producing a 30 {mu}m diameter Cs{sup +} beam routinely, but designed to operate ultimately at resolution as high as 1 {mu}m. The source features a high magnification sample viewing system in the reflected geometry, facilitating sample positioning and tuning of the primary beam. Isotope systems measured routinely at present include Pb and S isotopes, conducted at 1.5 to 2 MV terminal voltage. Lead isotopes are measured as Pb{sup 4+} ions, from either Pb{sup -}, PbO{sup -} or PbS{sup -} injected ions. Sulfur isotopes are measured as S{sup 2+} or S{sup 3+} ions from injected S{sup -} ions. A fast bouncing system will enable high precision isotopic ratio measurements, and has been proven at the low energy side to be capable of achieving precision at the 0.04% level. AUSTRALIS will be used for geochronology and stable isotopes applications previously limited to bulk applications, or inaccessible due to interference problems, and for trace element analysis with expected sensitivity below the parts-per-million level.

• OSTI ID: 21208030
• Journal Information: AIP Conference Proceedings, Vol. 475, Issue 1; Conference: 15. international conference on the application of accelerators in research and industry, Denton, TX (United States), 4-7 Nov 1998; Other Information: DOI: 10.1063/1.59207; (c) 1999 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
43 PARTICLE ACCELERATORS
ACCELERATORS
ACCURACY
AGE ESTIMATION
CESIUM IONS
INTERFERENCE
ION BEAMS
ISOTOPE RATIO
LEAD IONS
LEAD ISOTOPES
MASS SPECTRA
MASS SPECTROSCOPY
MULTI-ELEMENT ANALYSIS
QUANTITATIVE CHEMICAL ANALYSIS
RESOLUTION
SENSITIVITY
STABLE ISOTOPES
SULFUR IONS
SULFUR ISOTOPES
TRACE AMOUNTS