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Title: Wire breakage in SLC wire profile monitors

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.57029· OSTI ID:21202399
; ; ;  [1]
  1. Stanford Linear Accelerator Center P.O. Box 4349, Stanford, California 94309 (United States)

Wire-scanning beam profile monitors are used at the Stanford Linear Collider (SLC) for emittance preservation control and beam optics optimization. Twenty such scanners have proven most useful for this purpose and have performed a total of 1.5 million scans in the 4 to 6 years since their installation. Most of the essential scanners are equipped with 20 to 40 {mu}m tungsten wires. SLC bunch intensities and sizes often exceed 2x10{sup 7}particles/{mu}m{sup 2} (3C/m{sup 2}). We believe that this has caused a number of tungsten wire failures that appear at the ends of the wire, near the wire support points, after a few hundred scans are accumulated. Carbon fibers, also widely used at SLAC (1), have been substituted in several scanners and have performed well. In this paper, we present theories for the wire failure mechanism and techniques learned in reducing the failures.

OSTI ID:
21202399
Journal Information:
AIP Conference Proceedings, Vol. 451, Issue 1; Conference: 8. beam instrumentation workshop, Stanford, CA (United States), 4-7 May 1998; Other Information: DOI: 10.1063/1.57029; (c) 1998 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English