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Title: Technique for the metrology calibration of a Fourier transform spectrometer

Journal Article · · Applied Optics
DOI:https://doi.org/10.1364/AO.47.006009· OSTI ID:21175735

A method is presented for using a Fourier transform spectrometer (FTS) to calibrate the metrology of a second FTS. This technique is particularly useful when the second FTS is inside a cryostat or otherwise inaccessible.

OSTI ID:
21175735
Journal Information:
Applied Optics, Vol. 47, Issue 32; Other Information: DOI: 10.1364/AO.47.006009; (c) 2008 Optical Society of America; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6935
Country of Publication:
United States
Language:
English