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Title: Development and diagnostics of revised ion beam analyzer, ion or laser produced plasmas and X-ray pre-ionizer for gas lasers

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.53568· OSTI ID:21167498
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  1. Department of Energy Sciences, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama, Japan 226 (Japan)

A CCD element was tested as an end plate of a Thomson parabola analyzer. This element was directly irradiated by ion beams to produce electric signals associated with the beams. With a pin-hole camera, we also tried to measure the divergence angle of ion beams. Coated thin layers of ion source materials on a quartz plate were back-lighted by an e-beam pumped KrF laser, and the produced plasmas were observed to supply advanced source plasmas for pulsed ion diodes. We built a cryogenic target which was cooled by liquid nitrogen, and the ice-covered target was irradiated by proton beams to measure the concerned ablation processes. Fundamental characteristics of an X-ray source with wire-initiated discharge plasmas for pre-ionization of gas mixtures of our former discharge-pumped KrF laser in place of UV pre-ionization were also investigated.

OSTI ID:
21167498
Journal Information:
AIP Conference Proceedings, Vol. 406, Issue 1; Conference: 13. international conference on laser interactions and related plasma phenomena, Monterey, CA (United States), 13-18 Apr 1997; Other Information: DOI: 10.1063/1.53568; (c) 1997 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English