Stereological characterization of the {gamma}' particles in a nickel base superalloy: Comparison between transmission electron microscopy and atomic force microscopy techniques

Journal Article · Mon Sep 15 00:00:00 EDT 2008 · Materials Characterization

DOI:https://doi.org/10.1016/j.matchar.2007.10.006· OSTI ID:21140769

Feaugas, X ^[1]; Guillemer-Neel, C ^[2]; Clavel, M ^[3]

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1. Universite de la Rochelle, L.E.M.M.A., 17042 La Rochelle cedex 01 (France)
2. Universite Picardie Jules Verne, L.T.R.M.C., 80025 Amiens (France)
3. Ecole Centrale Paris, M.S.S.Mat., 92295 Chatenay-Malabry (France)

Critical comparison of transmission electron microscopy and atomic force microscopy techniques was provided concerning size measurements of {gamma}' precipitates in a nickel-base superalloy. The divergence between results is explained in terms of the resolution limit for atomic force microscopy, linked both to the tip dimension and the diameter of the investigated particles.

• OSTI ID: 21140769
• Journal Information: Materials Characterization, Vol. 59, Issue 9; Other Information: DOI: 10.1016/j.matchar.2007.10.006; PII: S1044-5803(07)00364-6; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMIC FORCE MICROSCOPY
COMPARATIVE EVALUATIONS
HEAT RESISTING ALLOYS
MICROSTRUCTURE
NICKEL BASE ALLOYS
PARTICLES
PRECIPITATION
TRANSMISSION ELECTRON MICROSCOPY