Transition edge sensors for bolometric applications: responsivity and saturation
- Detector and Optical Physics Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE (United Kingdom)
Microstrip-coupled transition edge sensors (TESs) combined with waveguide-horn technology produce sensitive bolometric detectors with well-defined, single-mode beam patterns and excellent polarization characteristics. These devices are now being deployed for astronomical observations. In bolometric applications, where power levels are monitored, the critical parameter that characterizes the detection is the power-to-current responsivity s{sub I}({omega}), where {omega} is the postdetection angular frequency. In real applications, such as on a ground-based telescope, the signal of interest is superimposed on a background such as the thermal emission from the atmosphere. The power emitted by the atmosphere changes slowly in time and these changes may change the responsivity of the detector. A detailed understanding of how s{sub I}({omega}) changes as a function of applied power levels and how the TES response saturates is vital for accurate calibration of astronomical data. In this paper we describe measurements of the changes in the current flowing through a TES as a function of the circuit bias and the applied power. From these measurements we calculate the efficiency of the coupling of power into the TES from a closely thermally coupled microstrip termination resistor and we determine the zero frequency responsivity s{sub I}(0) as a function of both the circuit bias and power. The variation of the responsivity is compared with predictions of a small-signal model: for the case when the loop gain L{sub I} is high, when simplifying approximations to the full solution to the electrothermal equations apply; and using the electrothermal parameters of the TES, determined by impedance measurements, as inputs to the full model solution. We find good agreement between theory and measurement in both cases in the relevant regimes.
- OSTI ID:
- 21137174
- Journal Information:
- Journal of Applied Physics, Vol. 103, Issue 8; Other Information: DOI: 10.1063/1.2909981; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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