Displacement fields U and V by interferometry of three beams

Journal Article · Tue Apr 15 00:00:00 EDT 2008 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2926781· OSTI ID:21137067

Martinez, Amalia; Rayas, J A; Anguiano-Morales, Marcelino; Mendoza, Fernando ^[1]; Meneses-Fabian, Cruz ^[2]

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1. Centro de Investigaciones en Optica, A. C., Leon, Gto. (Mexico)
2. Benemerita Universidad Autonoma de Puebla, Facultad de Ciencias Fisico-Matematicas, Puebla (Mexico)

The simultaneous measurement of the two in-plane displacement components by electronic speckle pattern interferometry with three objects beams and without in-line reference beam is presented. Three interference fringes patterns corresponding to three different sensitivity vectors are recorded in a single interferogram and separated by means of the Fourier transform method. Two interference fringes patterns are selected to obtain the in-plane displacement components.

• OSTI ID: 21137067
• Journal Information: AIP Conference Proceedings, Vol. 992, Issue 1; Conference: RIAO/OPTILAS 2007: RIAO: 6. Ibero-American conference on optics; OPTILAS: 9. Latin-American meeting on optics, lasers and applications, Campinas, Sao Paulo (Brazil), 21-26 Oct 2007; Other Information: DOI: 10.1063/1.2926781; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BEAMS
FOURIER TRANSFORMATION
INTERFERENCE
INTERFEROMETRY
OPTICAL FIBERS
SENSITIVITY
VECTORS