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Title: Shape controlled synthesis of CaMoO{sub 4} thin films and their photoluminescence property

Journal Article · · Journal of Solid State Chemistry
 [1];  [2];  [1];  [3];  [1]
  1. Laboratorio Interdisciplinar de Eletroquimica e Ceramica, Departamento de Quimica, Centro Multidisciplinar de Desenvolvimento de Materiais Ceramicos, Universidade Federal de Sao Carlos, C. Postal 676, 13565-905 Sao Carlos, SP (Brazil)
  2. Laboratorio de Semicondutores, Departamento de Fisica, Universidade Federal de Sao Carlos, C. Postal 676, 13565-905 Sao Carlos, SP (Brazil)
  3. CMDMC, LIEC, Instituto de Quimica, Universidade Estadual Paulista, 14801-907 Araraquara, SP (Brazil)

CaMoO{sub 4} (CMO) disordered and ordered thin films were prepared by the complex polymerization method (CPM). The films were annealed at different temperatures and time in a conventional resistive furnace (RF) and in a microwave (MW) oven. The microstructure and surface morphology of the structure were monitored by atomic force microscopy (AFM) and high-resolution scanning electron microscopy (HRSEM). Order and disorder were characterized by X-ray diffraction (XRD) and optical reflectance. A strong photoluminescence (PL) emission was observed in the disordered thin films and was attributed to complex cluster vacancies. The experimental results were compared with density functional and Hartree-Fock calculations. - Graphical abstract: CaMoO{sub 4} thin films were prepared by the complex polymerization method (CPM). The films were annealed at different temperatures and time in a conventional resistive furnace and in a microwave oven. A strong photoluminescence emission was observed in the disordered thin films and was attributed to complex cluster vacancies. The experimental results were confirmed by high level first principle calculations.

OSTI ID:
21128305
Journal Information:
Journal of Solid State Chemistry, Vol. 181, Issue 5; Other Information: DOI: 10.1016/j.jssc.2008.01.051; PII: S0022-4596(08)00079-0; Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English