Energy calibration of a high-resolution inelastic x-ray scattering spectrometer

Journal Article · Fri Aug 15 00:00:00 EDT 2008 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2968118· OSTI ID:21124119

Verbeni, Roberto; D'Astuto, Matteo; Krisch, Michael; Lorenzen, Maren; Mermet, Alain; Monaco, Giulio; Requardt, Herwig; Sette, Francesco ^[1]

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1. European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex (France)

The energy scale of a triple-axis x-ray spectrometer with meV energy resolution based on perfect silicon crystal optics is calibrated, utilizing the most recent determination of the silicon lattice parameter and its thermal expansion coefficient and recording the dispersion of longitudinal acoustic and optical phonons in a diamond single crystal and the molecular vibration mode in liquid nitrogen. Comparison of the x-ray results with previous inelastic neutron and Raman scattering results as well as with ab initio phonon dispersion calculations yields an overall agreement better than 2%.

• OSTI ID: 21124119
• Journal Information: Review of Scientific Instruments, Vol. 79, Issue 8; Other Information: DOI: 10.1063/1.2968118; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
36 MATERIALS SCIENCE
CALIBRATION
COMPARATIVE EVALUATIONS
DIAMONDS
DISPERSIONS
ENERGY RESOLUTION
LATTICE PARAMETERS
MEV RANGE
MONOCRYSTALS
NEUTRONS
OPTICS
OSCILLATION MODES
PHONONS
RAMAN EFFECT
SEMICONDUCTOR MATERIALS
SILICON
THERMAL EXPANSION
X RADIATION
X-RAY DIFFRACTION
X-RAY SPECTROMETERS