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Title: TEM and SIMS Analysis of (100), (110), and (111) Single Crystal Niobium

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2770680· OSTI ID:21067384
;  [1];  [2];  [3];  [1];  [4]
  1. Analytical Instrumentation Facility, North Carolina State University, MRC Building. Room 318, Raleigh, NC, 27695-7531 (United States)
  2. Materials Science Department, North Carolina State University, EB1 Building, Raleigh, NC 27695 (United States)
  3. Appalachian State University, 231 CAP Building, 525 Rivers St., Boone, NC 28608 (United States)
  4. Jefferson Lab, 12000 Jefferson Ave., Newport News, VA 23606 (United States)

Single crystal niobium specimens of (100), (110) and (111) crystal orientations have been analyzed using TEM and SIMS. The TEM specimens were prepared using Focused Ion Beam (FIB) and show niobium oxide thicknesses ranging from 4.9 to 8.3 nm for the three specimens after buffer chemical polishing. The oxide layers appear uniform and no significant sub-oxide region was noted. SIMS analysis was made for all three orientations on hydrogen, carbon, and oxygen before and after heat treatments at 90, 600, and 1250 deg. C. Hydrogen is at a high level between the oxide layer and niobium, but at a relatively low level in the oxide. No high oxygen concentration region was noted in the niobium below the oxide. C contamination on the surface is detected mainly at the surface. Analysis after heat treatments showed some decrease in hydrogen after the 600 deg. C heat treatment, and significant oxidation of the niobium after the 1250 deg. C heat treatment.

OSTI ID:
21067384
Journal Information:
AIP Conference Proceedings, Vol. 927, Issue 1; Conference: International niobium workshop on single crystal - large grain niobium technology, Araxa (Brazil), 30 Oct - 1 Nov 2006; Other Information: DOI: 10.1063/1.2770680; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English