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Title: Figures of merit for focusing mega-electron-volt ion beams in biomedical imaging and proton beam writing

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.2827106· OSTI ID:21064502
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  1. Department of Physics, University of Jyvaeskylae, P.O. Box 35 (YFL), FIN-40014 (Finland)

A figure of merit (FOM) has been developed for focusing quadrupole multiplet lenses for ion micro- and nanobeam systems. The method which is based on measurement of the central peak of the two-dimensional autocorrelation function of an image provides separate FOM for the horizontal and vertical directions. The approach has been tested by comparison with the edge widths obtained by nonlinear fitting the edge widths of a Ni grid and found to be reliable. The FOM has the important advantage for ion beam imaging of biomedical samples that the fluence needed is considerably lower than for edge fitting.

OSTI ID:
21064502
Journal Information:
Journal of Applied Physics, Vol. 103, Issue 1; Other Information: DOI: 10.1063/1.2827106; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English