Rietveld refinement of the semiconducting system Bi{sub 2-x}Fe{sub x}Te{sub 3} from X-ray powder diffraction
- Physics Department, Faculty of Science (Girls), Al-Azhar University, Cairo (Egypt)
The semiconducting system Bi{sub 2-x}Fe{sub x}Te{sub 3} (x = 0.0, 0.02, 0.04 and 0.08) was synthesized at 1000 deg. C for 30 h. The scanning electron microscope (SEM) image reveals the tendency of the Bi{sub 2-x}Fe{sub x}Te{sub 3} system to form a sheet structure with more pronounced alignment and to enhance the formation of some microstructure tubes. The structure of the system under study was refined on the basis of X-ray powder diffraction data using the Rietveld method. The analysis revealed the complete miscibility of Fe in the Bi{sub 2}Te{sub 3} matrix and hence the formation of single phase. The system crystallizes in the space group R-3m [1 6 6]. The lattice parameters and the unit cell size slightly change by the incorporation of Fe. The refinement of instrumental and structural parameters led to reliable values for the R{sub B}, R{sub F} and Chi{sup 2}.
- OSTI ID:
- 21062255
- Journal Information:
- Materials Research Bulletin, Vol. 42, Issue 12; Other Information: DOI: 10.1016/j.materresbull.2007.02.027; PII: S0025-5408(07)00052-9; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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