The evidence for synthesis of truncated triangular silver nanoplates in the presence of CTAB
Abstract
Truncated triangular silver nanoplates were prepared by a solution-phase approach, which involved the seed-mediated growth of silver nanoparticles in the presence of cetyltrimethylammonium bromide (CTAB) at 40 deg. C. The result of X-ray diffraction indicates that the as-prepared nanoparticles are made of pure face centered cubic silver. Transmission electron microscopy and atomic force microscopy studies show that the truncated triangular silver nanoplates, with edge lengths of 50 {+-} 5 nm and thicknesses of 27 {+-} 3 nm, are oriented differently on substrates of a copper grid and a fresh mica flake. The corners of these nanoplates are round. The selected area electron diffraction analysis reveals that the silver nanoplates are single crystals with an atomically flat surface. We determine the holistic morphology of truncated triangular silver nanoplates through the above measurements with the aid of computer-aided 3D perspective images.
- Authors:
-
- Key Laboratory of Silicate Materials Science and Engineering (Wuhan University of Technology), Ministry of Education, 122 Luoshi Road, Hongshan District, Wuhan, Hubei 430070 (China)
- Publication Date:
- OSTI Identifier:
- 21062209
- Resource Type:
- Journal Article
- Journal Name:
- Materials Characterization
- Additional Journal Information:
- Journal Volume: 59; Journal Issue: 4; Other Information: DOI: 10.1016/j.matchar.2007.02.015; PII: S1044-5803(07)00058-7; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; AMMONIUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; BROMIDES; COMPUTER-AIDED DESIGN; COPPER; ELECTRON DIFFRACTION; FCC LATTICES; IMAGES; MICA; MONOCRYSTALS; MORPHOLOGY; NANOSTRUCTURES; SILVER; SYNTHESIS; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Citation Formats
Xin, He, Zhao Xiujian, Yunxia, Chen, and Jinyang, Feng. The evidence for synthesis of truncated triangular silver nanoplates in the presence of CTAB. United States: N. p., 2008.
Web.
Xin, He, Zhao Xiujian, Yunxia, Chen, & Jinyang, Feng. The evidence for synthesis of truncated triangular silver nanoplates in the presence of CTAB. United States.
Xin, He, Zhao Xiujian, Yunxia, Chen, and Jinyang, Feng. 2008.
"The evidence for synthesis of truncated triangular silver nanoplates in the presence of CTAB". United States.
@article{osti_21062209,
title = {The evidence for synthesis of truncated triangular silver nanoplates in the presence of CTAB},
author = {Xin, He and Zhao Xiujian and Yunxia, Chen and Jinyang, Feng},
abstractNote = {Truncated triangular silver nanoplates were prepared by a solution-phase approach, which involved the seed-mediated growth of silver nanoparticles in the presence of cetyltrimethylammonium bromide (CTAB) at 40 deg. C. The result of X-ray diffraction indicates that the as-prepared nanoparticles are made of pure face centered cubic silver. Transmission electron microscopy and atomic force microscopy studies show that the truncated triangular silver nanoplates, with edge lengths of 50 {+-} 5 nm and thicknesses of 27 {+-} 3 nm, are oriented differently on substrates of a copper grid and a fresh mica flake. The corners of these nanoplates are round. The selected area electron diffraction analysis reveals that the silver nanoplates are single crystals with an atomically flat surface. We determine the holistic morphology of truncated triangular silver nanoplates through the above measurements with the aid of computer-aided 3D perspective images.},
doi = {},
url = {https://www.osti.gov/biblio/21062209},
journal = {Materials Characterization},
issn = {1044-5803},
number = 4,
volume = 59,
place = {United States},
year = {Tue Apr 15 00:00:00 EDT 2008},
month = {Tue Apr 15 00:00:00 EDT 2008}
}