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Title: Systematic Approach for Validation of X-Ray Automatic Defect Recognition Systems

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2718188· OSTI ID:21054958
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  1. John F. Welch Technology Centre, GE Global Research Centre, Bangalore (India)

With the advent of digital radiography, there has been a gradual shift from operators viewing images to find defects to totally automated defect recognition (ADR) systems. This has resulted in reduced operator subjectivity, reduced operator fatigue, and increased productivity. These automated defect recognition solutions are based on reference or non-reference based approaches or a combination of both. There exists some amount of uncertainty or reluctance to accept automated systems in view of no systematic quantified metrics available on performance of these ADR systems in comparison to human operators. This paper describes the metrics that one could follow to quantify the performance of ADR systems such as detectability for different defect types and sizes, accuracy, false call rate, robustness to various noise levels etc., As it might be difficult to have images with defects of various sizes, shapes, contrast and noise levels, a methodology to generate images with simulated defects with variability's in parameters such as size, shape, contrast to noise ratio etc., is demonstrated. This can be used to generate probability of detection estimates for different defect types and geometries. This will result in establishing confidence limits for ADR systems and can be used to judge if it would meet specific customer requirement. This would facilitate increase in the acceptability of ADR systems over current manual defect recognition systems for applications in various industries such as Castings, Oil and Gas, Aviation etc.

OSTI ID:
21054958
Journal Information:
AIP Conference Proceedings, Vol. 894, Issue 1; Conference: Conference on review of progress in quantitative nondestructive evaluation, Portland, OR (United States), 30 Jul - 4 Aug 2006; Other Information: DOI: 10.1063/1.2718188; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English