A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer

Journal Article · Fri Jan 19 00:00:00 EST 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2436095· OSTI ID:21052550

De Oliveira, N; Nahon, L; Polack, F ^[1]; Joyeux, D; Phalippou, D; Rodier, J C ^[2]; Vervloeet, M ^[3]

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1. Synchrotron Soleil-Orme des Merisiers St Aubin BP48 -91192 Gif sur Yvette (France)
2. Laboratoire Charles Fabry de l'Institut d'Optique, bat. 503, F91403 Orsay (France)
3. Laboratoire de Photophysique Moleculaire, bat. 350, F91403 Orsay (France)

A VUV Fourier transform spectrometer based on a wavefront division interferometer has been built. Our ultimate goal is to provide a high resolution absorption spectrometer in the 140 - 40 nm range using the new third generation French synchrotron source Soleil as the background continuum. Here, we present the design and latest performance of the instrument scanning control system. It is based on multiple reflections of a monomode, frequency-stabilized HeNe laser between two plane mirrors allowing the required sensitivity on the displacement of the interferometer mobile arm. The experimental results on the sampling precision show an rms error below 5 nm for a travel length of 7.5 mm.

• OSTI ID: 21052550
• Journal Information: AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436095; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ACCURACY
CONTROL SYSTEMS
DESIGN
FAR ULTRAVIOLET RADIATION
FOURIER TRANSFORM SPECTROMETERS
HELIUM-NEON LASERS
LASER RADIATION
MIRRORS
PERFORMANCE
REFLECTION
RESOLUTION
SAMPLING
SENSITIVITY
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES