skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: X-Ray Fluorescence Holographic Study on a Single-Crystal Thin Film of a Rewritable Optical Media

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2436304· OSTI ID:21049265
;  [1];  [2]; ;  [3]; ;  [4];  [4]
  1. Center for Materials Research Using Third-Generation Synchrotron Radiation Facilities, Hiroshima Institute of Technology, Hiroshima 731-5193 (Japan)
  2. Institute of Materials Research, Tohoku University, Sendai 980-8577 (Japan)
  3. Faculty of Information Sciences, Hiroshima City University, Hiroshima 731-3194 (Japan)
  4. Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology, Tsukuba 305-8562 (Japan)

In this article, we discuss X-ray fluorescence holography (XFH) using a third-generation synchrotron radiation facility through an application to a DVD-RAM material thin film. Three-dimensional atomic images were obtained at 100 K around the Ge atoms in a Ge2Sb2Te5 single-crystal thin film by means of XFH technique at the beamline BL37XU of the SPring-8 to clarify the high-speed writing and erasing mechanism of this DVD material. From the obtained XFH images, it was concluded that the single-crystal thin film has a mixture of rocksalt and zinc-blende structures. In addition, the images indicate large distortions associated with the existence of vacancies of the Ge(Sb) site. The present XFH results are in good agreement with the previous XAFS results, which has predicted a phase transition due to an umbrella flip motion of the Ge atom000.

OSTI ID:
21049265
Journal Information:
AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436304; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English