A low temperature scanning tunneling microscope for electronic and force spectroscopy

Journal Article · Thu Nov 15 00:00:00 EST 2007 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2804165· OSTI ID:21024589

Smit, R H. M.; Grande, R; Lasanta, B; Riquelme, J J; Agraiet, N ^[1]

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1. Laboratorio de Bajas Temperaturas, Departamento Fisica de la Materia Condensada C-III, Universidad Autonoma de Madrid, E-28049 Madrid (Spain)

In this article, we describe and test a novel way to extend a low temperature scanning tunneling microscope with the capability to measure forces. The tuning fork that we use for this is optimized to have a high quality factor and frequency resolution. Moreover, as this technique is fully compatible with the use of bulk tips, it is possible to combine the force measurements with the use of superconductive or magnetic tips, advantageous for electronic spectroscopy. It also allows us to calibrate both the amplitude and the spring constant of the tuning fork easily, in situ and with high precision.

• OSTI ID: 21024589
• Journal Information: Review of Scientific Instruments, Vol. 78, Issue 11; Other Information: DOI: 10.1063/1.2804165; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ACCURACY
AMPLITUDES
ATOMIC FORCE MICROSCOPY
CALIBRATION
QUALITY FACTOR
RESOLUTION
SCANNING TUNNELING MICROSCOPY
SPECTROSCOPY
SPRINGS
TUNING