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Title: Low-loss planar and stripe waveguides in Nd{sup 3+}-doped silicate glass produced by oxygen-ion implantation

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.2710293· OSTI ID:20982714
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  1. School of Physics and Microelectronics, Shandong University, Ji'nan 250100 (China)

We report on the fabrication and characterization of low-loss planar and stripe waveguides in a Nd{sup 3+}-doped glass by 6 MeV oxygen-ion implantation at a dose of 1x10{sup 15} ions/cm{sup 2}. The dark mode spectroscopy of the planar waveguide was measured using a prism coupling arrangement. The refractive index profile of the planar waveguide was reconstructed from a code based on the reflectivity calculation method. The results indicate that a refractive index enhanced region as well as an optical barrier have been created after the ion beam processing. The near-field mode profiles of the stripe waveguide were obtained by an end-fire coupling arrangement, by which three quasitransverse electric modes were observed. After annealing, the propagation losses of the planar and stripe waveguides were reduced to be {approx}0.5 and {approx}1.8 dB/cm, respectively.

OSTI ID:
20982714
Journal Information:
Journal of Applied Physics, Vol. 101, Issue 5; Other Information: DOI: 10.1063/1.2710293; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English