Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics

Journal Article · Mon Apr 02 00:00:00 EDT 2007 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2719653· OSTI ID:20960199

Mokso, R; Cloetens, P; Maire, E; Ludwig, W; Buffiere, J -Y ^[1]

---

1. European Synchrotron Radiation Facility (ESRF), F-38043 Grenoble (France)

To overcome the limitations in terms of spatial resolution and field of view of existing tomography techniques, a hard x-ray projection microscope is realized based on the sub-100-nm focus produced by Kirkpatrick-Baez optics. The sample is set at a small distance downstream of the focus and Fresnel diffraction patterns with variable magnification are recorded on a medium-resolution detector. While the approach requires a specific phase retrieval procedure and correction for mirror imperfections, it allows zooming nondestructively into bulky samples. Quantitative three-dimensional nanoscale microscopy is demonstrated on an aluminum alloy in local tomography mode.

• OSTI ID: 20960199
• Journal Information: Applied Physics Letters, Vol. 90, Issue 14; Other Information: DOI: 10.1063/1.2719653; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
36 MATERIALS SCIENCE
ALUMINIUM ALLOYS
COMPUTERIZED TOMOGRAPHY
DIFFRACTION
HARD X RADIATION
MICROSCOPES
MICROSCOPY
NANOSTRUCTURES
NONDESTRUCTIVE TESTING
OPTICS
SPATIAL RESOLUTION
THREE-DIMENSIONAL CALCULATIONS