Synchrotron radiation x-ray beam profile monitor using chemical vapor deposition diamond film

Journal Article · Fri Dec 15 00:00:00 EST 2006 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2403843· OSTI ID:20951072

Kudo, Togo; Takahashi, Sunao; Nariyama, Nobuteru; Hirono, Toko; Tachibana, Takeshi; Kitamura, Hideo ^[1]

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1. SPring-8/Japan Synchrotron Radiation Research Institute, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)

Photoluminescence (PL) of a Si-doped polycrystalline diamond film fabricated using the chemical vapor deposition technique was employed to measure the profile of a synchrotron radiation pink x-ray beam emitted from an in-vacuum hybrid undulator at the SPring-8 facility. The spectrum of the section of the diamond film penetrated by the emitted visible red light exhibited a peak at 739 nm and a wideband structure extending from 550 to 700 nm. The PL intensity increased with the absorbed dose of the incident beam in the diamond within a dynamic range of 10{sup 3}. A two-dimensional distribution of the PL intensity revealed the undulator beam profile.

• OSTI ID: 20951072
• Journal Information: Review of Scientific Instruments, Vol. 77, Issue 12; Other Information: DOI: 10.1063/1.2403843; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEAM PROFILES
BEAMS
CHEMICAL VAPOR DEPOSITION
COATINGS
DIAMONDS
DOPED MATERIALS
MONITORS
PHOTOLUMINESCENCE
POLYCRYSTALS
RADIATION DOSES
SPRING-8 STORAGE RING
SYNCHROTRON RADIATION
THIN FILMS
TWO-DIMENSIONAL CALCULATIONS
VISIBLE RADIATION
WIGGLER MAGNETS
X RADIATION
X-RAY DETECTION