An X-Ray Absorption Edge Detector for High-Resolution Measurement of Undulator Effective K-Parameter

Journal Article · Mon Nov 20 04:00:00 UTC 2006 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2401446· OSTI ID:20894958

Yang, B ^[1]; Galayda, J N ^[2]

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1. Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States)
2. Stanford Linear Accelerator Center2575 Sand Hill Road, Menlo Park, CA 94025 (United States)

The spectrum of angle-integrated undulator radiation displays a sharp edge at every harmonic photon energy. A technique utilizing this feature to measure minute changes in K-parameters of an undulator in a free-electron laser has been proposed. To date, this technique requires the use of crystal monochromators as bandpass filters whose energy centroid depends on the incident angle of the x-ray beam. In this work we propose to use the absorption edge of an appropriate element as an energy-selective detector whose response is truly independent of the angle of the x-ray beam, and hence independent of electron beam direction and emittance. We will discuss the basic design concept of the detection system and illustrate its projected performance with computer simulations.

• OSTI ID: 20894958
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 868; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION
COMPUTERIZED SIMULATION
CRYSTALS
DESIGN
ELECTRON BEAMS
FREE ELECTRON LASERS
MONOCHROMATORS
PERFORMANCE
PHOTONS
RESOLUTION
WIGGLER MAGNETS
X RADIATION