Preparation and properties of a novel piezoelectric single-crystal material: Sr{sub 3}TaGa{sub 3}Si{sub 2}O{sub 14}

Journal Article · Tue Jun 08 00:00:00 EDT 2004 · Materials Research Bulletin

DOI:https://doi.org/10.1016/j.materresbull.2004.03.011· OSTI ID:20888071

Zengmei, Wang; Duorong, Yuan; Dong, Xu; Mengkai, Lue; Xiufeng, Cheng; Lihu, Pan

We have grown a new langasite-type piezoelectric single crystal Sr{sub 3}TaGa{sub 3}Si{sub 2}O{sub 14} (STGS) with dimensions of 15 mm in diameter and 30 mm in length by using the Czochralski technique. The X-ray powder diffraction (XRPD) of single crystal was performed at room temperature. The thermal expansion coefficient perpendicular to Z direction has been measured as 3.2x10{sup -6} K{sup -1} between 343.15 and 493.15 K, and along Z-axis, 9.7x10{sup -6} K{sup -1} between 318.15 and 503.15 K. The specific heat of the crystal has been measured as 0.68 J g{sup -1} K{sup -1} at 468.15 K. The transmittance spectra from 200 to 3200 nm annealed in different atmospheres were measured.

• OSTI ID: 20888071
• Journal Information: Materials Research Bulletin, Vol. 39, Issue 7-8; Other Information: DOI: 10.1016/j.materresbull.2004.03.011; PII: S0025540804000686; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANNEALING
CRYSTAL GROWTH
CRYSTAL STRUCTURE
GADOLINIUM OXIDES
MONOCRYSTALS
PIEZOELECTRICITY
POTASSIUM IONS
SILICON OXIDES
SPECIFIC HEAT
STRONTIUM OXIDES
TANTALUM OXIDES
TEMPERATURE RANGE 0273-0400 K
THERMAL EXPANSION
X-RAY DIFFRACTION